The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Feb. 25, 2013
The Board of Trustees of the University of Illinois, Urbana, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
Methods mapping a characteristic parameter of a specimen, such as a scattering mean free path and a scattering anisotropy factor, based on a quantitative phase shift measurement. The methods have steps of using spatial light interference microscopy (SLIM) to determine a quantitative phase shift as a function of position in a sample, and applying a generalized scatter-phase transformation to derive at least one of a scattering mean free path (MFP), a scattering anisotropy factor, and a thickness-independent parameter as a function of position in the sample. In some cases, the sample may be a slice of tissue or a cell.