The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2015

Filed:

May. 31, 2012
Applicants:

Hiroshi Takahashi, Tsukuba, JP;

Fumihiko Ito, Tsukuba, JP;

Xinyu Fan, Tsukuba, JP;

Yusuke Koshikiya, Tsukuba, JP;

Inventors:

Hiroshi Takahashi, Tsukuba, JP;

Fumihiko Ito, Tsukuba, JP;

Xinyu Fan, Tsukuba, JP;

Yusuke Koshikiya, Tsukuba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/3109 (2013.01); G01M 11/319 (2013.01);
Abstract

A test pulse is generated from a first and a second test light beam pulse with different wavelengths, with a predetermined time difference applied between the first and the second test light beam pulse. A circulator inputs the test pulse to a trunk fiber of a measurement target fiber line. A reflected light is extracted which is output from an input end of the trunk fiber. A filter extracts stimulated Brillouin backscattered light. A receiver receives and converts the scattered light into an electrical signal. A processing device carries out the signal to determine in which of N branched fibers the stimulated Brillouin scattered light is generated, while varying a time difference between the first and the second test pulse.


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Takahashi, Hiroshi. (2015). Optical fiber line characteristic analysis apparatus and analysis method thereof (U.S. Patent No. 8928868). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8928868

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