The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8928856 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 06, 2015

Filed:

Dec. 28, 2009
Applicant:

Kazuya Ono, Saitama, JP;

Inventor:

Kazuya Ono, Saitama, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/42 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 7/7085 (2013.01); G03F 7/70825 (2013.01); G03F 7/706 (2013.01); G03F 7/70341 (2013.01); G03F 7/70716 (2013.01); G03F 7/70266 (2013.01); G03F 7/707 (2013.01);
Abstract

An exposure apparatus for forming a predetermined pattern on a substrate by using exposure light, includes a stage apparatus which is movable with respect to an optical axis of the exposure light; a light-transmissive member provided at the stage apparatus, wherein a liquid is supplied on an upper surface of the light-transmissive member; and a measurement device which is settable below the light-transmissive member when measurement using the measurement device is performed. Leakage or entrance of a liquid used for exposure into an optical measurement device such as a wavefront aberration measurement device can be prevented, thereby enabling preferable optical adjustment such as imaging performance or optical characteristics.


Find Patent Forward Citations

Ono, Kazuya. (2015). Exposure apparatus and device fabrication method (U.S. Patent No. 8928856). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8928856

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