Semiconductor integrated circuit and an operating method thereof, a timing verifying method for a semiconductor integrated circuit and a test method of a semiconductor integrated circuit

Abstract

A semiconductor integrated circuit which includes a control circuit; and a power management integrated circuit (IC) configured to supply an operating voltage to the control circuit. The control circuit includes a clock generator; a processor unit; a temperature sensor; a body bias generator; and a controller. The controller controls the power management IC and the clock generator when temperature data indicates a temperature higher than a high temperature and controls the power management IC or the body bias generator when the temperature data indicates a temperature lower than a low temperature. The high temperature is lower than a hot temperature of the control circuit and the low temperature is higher than a cold temperature of the control circuit and lower than the high temperature.