The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Nov. 30, 2011
Darren E. Atkinson, La Habra, CA (US);
Scott A. Avent, Fountain Valley, CA (US);
Darren E. Atkinson, La Habra, CA (US);
Scott A. Avent, Fountain Valley, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
A method for measuring s-parameters of an N-port device under test (DUT), using an N-port test fixture and a network analyzer. The method includes: measuring calibration errors of the N-port test fixture using a reduced set of N/2 calibration standards; measuring calibration errors due to the network analyzer by calibrating only the network analyzer using analyzer-only calibration standards; isolating test fixture s-parameters errors using results of the analyzer-only calibration standards measurement and the N-port test fixture calibration standard measurement; measuring the s-parameters errors of the DUT; and correcting the s-parameters errors of the DUT corresponding to the isolated test fixture s-parameters errors and the calibration errors of the network analyzer.