The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Sep. 03, 2009
Applicants:
Nobutaka Iwahashi, Kanagawa, JP;
Masashi Ogiyama, Kanagwa, JP;
Shinichi Morishima, Kanagawa, JP;
Inventors:
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09B 31/30 (2006.01); C09B 31/28 (2006.01); B05D 3/06 (2006.01); B05D 5/06 (2006.01); G02B 5/30 (2006.01); C09B 31/04 (2006.01); C09B 31/08 (2006.01); C09B 31/18 (2006.01); C09B 56/02 (2006.01); C09B 56/08 (2006.01); G02B 5/22 (2006.01);
U.S. Cl.
CPC ...
G02B 5/3033 (2013.01); C09B 31/04 (2013.01); C09B 31/08 (2013.01); C09B 31/18 (2013.01); C09B 31/28 (2013.01); C09B 31/30 (2013.01); C09B 56/02 (2013.01); C09B 56/08 (2013.01); G02B 5/223 (2013.01); G02B 5/3016 (2013.01); G02F 2202/40 (2013.01);
Abstract
A light absorption anisotropic film, having at least one dichroic dye, in which the light absorption anisotropic film shows a diffraction peak derived from a periodic structure in a direction in a plane of the light absorption anisotropic film in X-ray diffraction measurement and the diffraction peak has a half width of 1.0 Å or less.