The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2015
Filed:
Jun. 22, 2010
Lothar Auerswald, Dobeln, DE;
Christian Fanselow, Geringswalde, DE;
Lothar Auerswald, Dobeln, DE;
Christian Fanselow, Geringswalde, DE;
Abstract
A measuring apparatus, especially a measuring apparatus suitable for application in industrial process measurements technology for making measurements of physical or chemical, measured variables in a closed process container under increased pressure, comprising: a measuring probe, which has a probe shaft, especially a cylindrical probe shaft; and a securement apparatus to affix the measuring probe at a measuring point, wherein the securement apparatus comprises a sleeve, which at least sectionally accommodates probe shaft, wherein the measuring probe has a securement collar connected to the probe shaft; the securement collar is held, especially shape interlocked, between a coupling jacket releasably secured in sleeve and a counterbearing formed within sleeve, characterized in that, a first abutment surface is formed within the coupling jacket, and a second abutment surface, which lies opposite the first abutment surface, is formed on measuring probe.