The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2015

Filed:

Dec. 06, 2011
Applicant:

David M. Korpi, Pacific Grove, CA (US);

Inventor:

David M. Korpi, Pacific Grove, CA (US);

Assignee:

Sierra Instruments, Inc., Monterey, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G 3/16 (2006.01);
U.S. Cl.
CPC ...
G01G 3/16 (2013.01);
Abstract

The subject invention provides improved means to measure mass collected on a sample collection surface in real time. A resonant structure is used as the 'scale' to determine the mass in real time. The invention employs a membrane, or collection substrate, on the end of a resonant structure resonating in the longitudinal direction. A structure resonating in the longitudinal mode offers a considerably higher resonant frequency than the same structure in the bending mode. The higher the resonant frequency, the more resolution in the frequency of oscillation is available to determine the mass of the collection surface or membrane. The present invention implements this attribute in connection with such a structure.


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