The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Feb. 12, 2013
Applicant:

Concurix Corporation, Kirkland, WA (US);

Inventors:

Russell S. Krajec, Loveland, CO (US);

Ying Li, Bellevue, WA (US);

Assignee:

Concurix Corporation, Kirkland, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01); G06F 11/34 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3466 (2013.01); G06F 11/3604 (2013.01); G06F 2201/865 (2013.01); G06F 11/3644 (2013.01); G06F 11/3636 (2013.01); G06F 11/3476 (2013.01);
Abstract

Tracer objectives in a distributed tracing system may be compared to identify input parameters that may have a high statistical relevancy. An iterative process may traverse multiple input objects by comparing results of multiple tracer objectives and scoring possible input objects as being possibly statistically relevant. With each iteration, statistically irrelevant input objects may be discarded from a tracer objective and other potentially relevant objects may be added. The iterative process may converge on a set of statistically relevant input objects for a given measured value without a priori knowledge of an application being traced.


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