The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Sep. 28, 2007
Applicants:

Richard Chang, Austin, TX (US);

Sriram Sankaranarayanan, Plainsboro, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Franjo Ivancic, Jersey City, NJ (US);

Inventors:

Richard Chang, Austin, TX (US);

Sriram Sankaranarayanan, Plainsboro, NJ (US);

Guofei Jiang, Princeton, NJ (US);

Franjo Ivancic, Jersey City, NJ (US);

Assignee:

NEC Laboratories America, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01);
Abstract

A system and method for analyzing a computer program includes performing a static analysis on a program to determine property correctness. Test cases are generated and conducted to provide test output data. Hypotheses about aspects of execution of the program are produced to classify paths for test cases to determine whether the test cases have been encountered or otherwise. In accordance with the hypothesis, new test cases are generated to cause the program to exercise behavior which is outside of the encountered test cases.


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