The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Feb. 05, 2013
Hongik University Industry-academic Cooperation Foundation, Seoul, KR;
Daegu National University of Education Industry-academic Cooperation Foundation, Daegu, KR;
Hyun-seung Son, Chungcheongnam-do, KR;
Woo-yeol Kim, Gyeonggi-do, KR;
Robertyoungchul Kim, Seoul, KR;
Abstract
Disclosed herein are an apparatus and a method for generating a multi-level test case for testing software from a unified modeling language (UML) sequence diagram (SD) based on a multiple condition control flow graph (MCCFG). The apparatus includes: a UML SD metamodel storing unit storing a UML SD metamodel defined for a model to be converted therein; an MCCFG metamodel storing unit storing an MCCFG metamodel; a model converting unit model-converting the UML SD from which the test case is to be generated according to the UML SD metamodel and the MCCFG metamodel to generate the MCCFG; and a coverage criteria unit converting the MCCFG into a tree structure and then converting the tree structure into test cases according to a selection command.