The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Oct. 29, 2007
Wendy K. Foslien, Woodbury, MN (US);
Soumitri N. Kolavennu, Minneapolis, MN (US);
Dinkar Mylaraswamy, Fridley, MN (US);
Dal Vernon C. Reising, Canton, MI (US);
Wendy K. Foslien, Woodbury, MN (US);
Soumitri N. Kolavennu, Minneapolis, MN (US);
Dinkar Mylaraswamy, Fridley, MN (US);
Dal Vernon C. Reising, Canton, MI (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
At least one statistical output associated with a process model and a rate of change associated with each statistical output is identified, such as by using historical data associated with the process model. The statistical outputs and the rates of change are used to generate a graphical display, such as a phase plane plot. Each point in the display is based on one of the statistical outputs and its associated rate of change. The graphical display could include multiple portions, such as quadrants, and one of the portions can be selected and highlighted. The different portions of the graphical display may represent whether the process model is a poor fit to current conditions and approaching a better fit, a poor fit and approaching a poorer fit, a good fit and approaching a poorer fit, and a good fit and approaching a better fit.