The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Mar. 15, 2011
Takeichiro Nishikawa, Kanagawa-ken, JP;
Minoru Nakatsugawa, Kanagawa-ken, JP;
Ryusei Shingaki, Tokyo, JP;
Takeichiro Nishikawa, Kanagawa-ken, JP;
Minoru Nakatsugawa, Kanagawa-ken, JP;
Ryusei Shingaki, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
According to one embodiment, a measurement unit periodically measures a usage status of a measurement target, and measures each test item of the measurement target at an arbitrary timing according to a test schedule. A first storage unit stores the usage status and a test result in time series. A second storage unit stores statistic information representing a relationship between the usage status and the test result. A probability calculation unit calculates a first evaluation value representing a load of the measurement target at a recent timing and a second evaluation value representing a load of the measurement target at the arbitrary timing, based on the usage status, and calculates a specific probability of each test item, based on the statistic information, the first evaluation value and the second evaluation value. A test schedule creation unit creates a new test schedule having selected test items, based on the specific probability.