The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Sep. 07, 2011
Applicants:

Theo Balkenende, Enschede, NL;

Hans Scheerder, Almelo, NL;

Oliver Sing, La Habra Heights, CA (US);

Tom Van 't Erve, Enschede, NL;

Inventors:

Theo Balkenende, Enschede, NL;

Hans Scheerder, Almelo, NL;

Oliver Sing, La Habra Heights, CA (US);

Tom van 't Erve, Enschede, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4097 (2006.01); G05B 19/4069 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4069 (2013.01); G05B 19/4097 (2013.01); G05B 2219/35134 (2013.01); G05B 2219/35159 (2013.01); G05B 2219/36268 (2013.01); G05B 2219/36299 (2013.01);
Abstract

Methods for computer-aided manufacturing and design, and corresponding systems and computer-readable mediums. A method includes receiving a three-dimensional (3D) solid part model and an associated 3D solid blank. The method includes defining an initial in-process workpiece (IPW) as the same as the 3D solid blank, and defining a cut volume in-process feature to be removed from the IPW. The method includes removing the cut volume in-process feature from the IPW. The method can include calculating and storing the cut volume in-process feature or the updated IPW with the removed cut volume in-process feature. The updated in-process workpiece can be calculated and displayed for each state at all times, in various embodiments.


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