The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Jan. 07, 2013
Wen-jun Wu, Novi, MI (US);
Joseph a Cilluffo, Sterling Heights, MI (US);
BO Robert Zhou, Bloomfield Hills, MI (US);
Wen-Jun Wu, Novi, MI (US);
Joseph A Cilluffo, Sterling Heights, MI (US);
Bo Robert Zhou, Bloomfield Hills, MI (US);
Chrysler Group LLC, Auburn Hills, MI (US);
Abstract
An iterative process for determining an aperture in a representation of an object is disclosed. The object is received and a bounding box corresponding thereto is determined. The bounding box includes a plurality of initial voxels and the object is embedded therein. An intersecting set of initial voxels is determined, as well as an internal set and an external set of initial voxels. The resolution of the voxels is iteratively decreased until the ratio of internal voxels to external voxels exceeds a predetermined threshold. The voxels corresponding to the final iteration are the final voxels. An internal set of final voxels is determined. A union set of initial voxels is determined indicating an intersection between the external set of initial voxels and the internal set of final voxels. From the union set of initial voxels and the external set of initial voxels, a location of an aperture is determined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile