The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Aug. 15, 2008
Applicants:

Nicholas John Weston, Peebles, GB;

Yvonne Ruth Huddart, Edinburgh, GB;

Andrew John Moore, Edinburgh, GB;

Inventors:

Nicholas John Weston, Peebles, GB;

Yvonne Ruth Huddart, Edinburgh, GB;

Andrew John Moore, Edinburgh, GB;

Assignee:

Renishaw PLC, Wotton-under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 11/02 (2006.01); G01B 11/00 (2006.01); G01B 11/25 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/007 (2013.01); G01B 11/026 (2013.01); G01B 11/2527 (2013.01); G06T 7/0057 (2013.01);
Abstract

A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images.


Find Patent Forward Citations

Loading…