The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Apr. 29, 2011
Jeffrey C. Wehnes, Richardson, TX (US);
David S. Harding, Austin, TX (US);
Jeffrey C. Wehnes, Richardson, TX (US);
David S. Harding, Austin, TX (US);
vuCOMP, Inc., Plano, TX (US);
Abstract
An image analysis embodiment comprises generating a bulge mask from a digital image, the bulge mask comprising potential convergence hubs for spiculated anomalies, detecting ridges in the digital image to generate a detected ridges map, projecting the detected ridges map onto a set of direction maps having different directional vectors to generate a set of ridge direction) projection maps, determining wedge features for the potential convergence hubs from the set of ridge direction projection maps, selecting ridge convergence hubs from the potential convergence hubs having strongest wedge features, extracting classification features for each of the selected ridge convergence hubs, and classifying the selected ridge convergence hubs based on the extracted classification features.