The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Dec. 03, 2013
The University of Chicago, Chicago, IL (US);
The University of Chicago, Chicago, IL (US);
Abstract
A system and method are provided for reconstructing images from limited or incomplete data, such as few view data or limited angle data or truncated data generated from divergent beams. The method and apparatus may iteratively constrain the variation of an estimated image in order to reconstruct the image. To reconstruct an image, a first estimated image may be generated. Estimated data may be generated from the first estimated image, and compared with the actual data. The comparison of the estimated data with the actual data may include determining a difference between the estimated and actual data. The comparison may then be used to generate a new estimated image. For example, the first estimated image may be combined with an image generated from the difference data to generate a new estimated image. To generate the image for the next iteration, the variation of the new estimated image may be constrained.