The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Jun. 22, 2012
Jean-baptiste Thibault, Waukesha, WI (US);
Charles A. Bouman, Jr., Lafayette, IN (US);
Ruoqiao Zhang, Lafayette, IN (US);
Jiang Hsieh, Brookfield, WI (US);
Ken David Sauer, South Bend, IN (US);
Jean-Baptiste Thibault, Waukesha, WI (US);
Charles A. Bouman, Jr., Lafayette, IN (US);
Ruoqiao Zhang, Lafayette, IN (US);
Jiang Hsieh, Brookfield, WI (US);
Ken David Sauer, South Bend, IN (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for reconstructing image component densities of an object includes acquiring multi-spectral x-ray tomographic data, performing a material decomposition of the multi-spectral x-ray tomographic data to generate a plurality of material sinograms, and reconstructing a plurality of material component density images by iteratively optimizing a functional that includes a joint likelihood term of at least two of the material decomposed sinograms. An x-ray tomography imaging system and a non-transitory computer readable medium are also described herein.