The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Nov. 10, 2006
Applicants:

Paulo Ricardo Mendonca, Clifton Park, NY (US);

Rahul Bhotika, Albany, NY (US);

Wesley David Turner, Rexford, NY (US);

Jingbin Wang, Allston, MA (US);

Saad Ahmed Sirohey, Pewaukee, WI (US);

Inventors:

Paulo Ricardo Mendonca, Clifton Park, NY (US);

Rahul Bhotika, Albany, NY (US);

Wesley David Turner, Rexford, NY (US);

Jingbin Wang, Allston, MA (US);

Saad Ahmed Sirohey, Pewaukee, WI (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0081 (2013.01); G06T 7/0012 (2013.01); G06T 7/0087 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/30028 (2013.01); G06T 2207/30061 (2013.01);
Abstract

A method and system for visualizing regions in an image is provided. The method comprises computing a regional response around a region in the image, deriving a region score based on from the regional response for the region and labeling the region in the image by comparing the region score to a plurality of probabilistic models.


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