The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Apr. 11, 2013
Applicant:
Massachuetts Institute of Technology, Cambridge, MA (US);
Inventors:
Robert A. Huber, Schnaitsee, DE;
James G. Fujimoto, Medford, MA (US);
Desmond C. Adler, Melrose, MA (US);
Assignee:
Massachusettes Institute of Technology, Cambridge, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
H01S 3/10 (2006.01); H01S 3/098 (2006.01); H01S 3/11 (2006.01); H01S 3/137 (2006.01); H01S 3/13 (2006.01); H01S 3/08 (2006.01); H01S 3/067 (2006.01); H01S 3/106 (2006.01); G01N 21/65 (2006.01); G01N 21/17 (2006.01); H01S 3/07 (2006.01);
U.S. Cl.
CPC ...
H01S 3/1106 (2013.01); H01S 3/137 (2013.01); H01S 3/08027 (2013.01); H01S 3/06725 (2013.01); H01S 3/06791 (2013.01); H01S 3/106 (2013.01); G01N 2021/653 (2013.01); G01N 2021/1787 (2013.01); H01S 3/1305 (2013.01); H01S 3/0675 (2013.01); H01S 3/1109 (2013.01); H01S 3/06712 (2013.01); H01S 2301/04 (2013.01); H01S 3/07 (2013.01); H01S 3/1062 (2013.01);
Abstract
A control system for improving and stabilizing Fourier domain mode locking (FDML) operation. The control system may also provide regulation of FDML operational parameters such as filter tuning, laser gain, polarization, polarization chromaticity, elliptical polarization retardance, and/or dispersion. The control system may be located internal to or external from the FDML laser cavity.