The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Sep. 14, 2012
Katsuhiro Oyama, Tokyo, JP;
Masato Ikeda, Tokyo, JP;
Katsuhiro Oyama, Tokyo, JP;
Masato Ikeda, Tokyo, JP;
Taiyo Yuden Co., Ltd., Tokyo, JP;
Abstract
A technique for measuring displacement involves passing parallel laser light from a laser light source through a first diffraction grating to a semi-transparent semi-reflective mirror. A portion of the laser light is reflected as first reversed light, which passes through the first diffraction grating. The remainder of the parallel laser light proceeds to a total reflection mirror and is reflected as second reversed light that passes through the semi-transparent semi-reflective mirror and the first diffraction grating. The amount of refracted light of a predetermined order that is of the first and second reversed light and that results from the first diffraction grating is detected by a first optical sensor, and the amount of displacement is obtained from the interference band or a signal thereof corresponding to the amount of relative motion in the axial direction of the total reflection mirror with respect to the semi-transparent semi-reflective mirror.