The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Nov. 22, 2011
Reiner Rygiel, Altrip, DE;
Reiner Rygiel, Altrip, DE;
Leica Microsystems CMS GmbH, Wetzler, DE;
Abstract
A confocal laser scanning microscope for examining a sample has a light source, which generates an illumination light beam, and a scanning unit which deflects the illumination light beam such that it optically scans the sample. A main beam splitter separates the illumination light beam from detection light emerging from the sample. The detection light separated from the illumination light beam passes at least partially through a detection pinhole diaphragm. At least two detector units detect the detection light passing through the detection pinhole diaphragm. An optical element is arranged in the beam direction between the detection pinhole diaphragm and the detector units and splits the detection light into at least two beam bundles and spectrally decomposes it within the beam bundles.