The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8922773 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 30, 2014

Filed:

Dec. 29, 2011
Applicant:

Jeff A. Wagner, Long Valley, NJ (US);

Inventor:

Jeff A. Wagner, Long Valley, NJ (US);

Assignee:

Rudolph Research Analytical Inc., Hackettstown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01N 21/21 (2006.01);
U.S. Cl.
CPC ...
G01J 4/00 (2013.01); G01N 21/21 (2013.01);
Abstract

A system and method for polarimetry are disclosed in which a polarimeter may include a light source for transmitting a light beam through a sample within a container; a wavelength selector configured to specify a target wavelength at which the polarization rotation of the light beam emerging from the sample will be evaluated; a polarization rotator configured to be selectively moved into and out of a path of the light beam from the light source; and a detector for obtaining a first measurement of the light beam polarization rotation with the polarization rotator outside the path of the light beam, and a second measurement of the light beam polarization rotation with the polarization rotator within the path of the light beam, with both measurements occurring at the wavelength resulting from the configuration of the wavelength selector.


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