The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Jun. 29, 2011
Applicants:
Jeremy Georges Bertin, Plainfield, CA;
Rajesh Kumar Singh, Deerfield, OH (US);
Markus Ingo Hoffmann, Marktlustenau, DE;
Randolph William Lumsden, Belleville, CA;
Inventors:
Jeremy Georges Bertin, Plainfield, CA;
Rajesh Kumar Singh, Deerfield, OH (US);
Markus Ingo Hoffmann, Marktlustenau, DE;
Randolph William Lumsden, Belleville, CA;
Assignee:
The Procter & Gamble Company, Cincinnati, OH (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); H04N 7/18 (2006.01); G06T 7/00 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G01N 21/95607 (2013.01); G06T 2207/30124 (2013.01); G06T 2207/30144 (2013.01);
Abstract
System and method to inspect hygienic articles. Defects are detected using a vision system by comparing an inspection image of a component to a reference image of a defect-free component. Detection of a defect can then be used to reject components and perform other functions.