The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Oct. 18, 2011
Jonas Fölling, Heidelberg, DE;
Jonas Fölling, Heidelberg, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A method and an apparatus for imaging a sample structure () with a light microscope are described. The sample structure () is prepared with markers and an active marker subset is generated in that a part of the markers is brought into a state in which they can be imaged. When a predetermined activation state is present, the sample structure () is imaged onto an arrangement () of sensor elements which each generate an image signal, these image signals resulting in a single frame of the sample structure (). The presence of a predetermined activation state is checked in that at least two test single frames are generated at an interval, and the respective change of the image signal between the two test single frames is detected. The presence of the predetermined activation state is determined when the detected changes of the image signals in their entirety exceed a quantity.