The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Nov. 01, 2011
Applicant:

Chae-kyu Jang, Gyeonggi-do, KR;

Inventor:

Chae-Kyu Jang, Gyeonggi-do, KR;

Assignee:

Hynix Semiconductor Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03B 1/00 (2006.01); H03K 3/00 (2006.01); G11C 29/12 (2006.01); G11C 29/48 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01); G11C 29/48 (2013.01); G01R 31/31721 (2013.01); G11C 29/12005 (2013.01);
Abstract

A semiconductor device and a power voltage supply circuit for a test operation of a semiconductor system including the semiconductor device. The semiconductor device receives first and second power supply voltages in a normal operation mode from an external device and receives the first power supply voltage in a test operation mode. The semiconductor device includes a voltage level setting unit configured to set a power connection node at a voltage between a voltage level of a first power supply voltage terminal and a voltage level of a ground voltage terminal according to an operation mode signal, and a voltage driving unit configured to drive a second power supply voltage terminal with the first power supply voltage in the test operation mode, wherein the driving power is controlled according to the voltage level of the power connection node.


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