The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Sep. 19, 2011
Applicants:
Nazih Almalki, Waterloo, CA;
Christopher Harris Snow, Kitchener, CA;
Jeffrey Alton Hugh Dods, Kitchener, CA;
Adam Louis Parco, Kitchener, CA;
Inventors:
Nazih Almalki, Waterloo, CA;
Christopher Harris Snow, Kitchener, CA;
Jeffrey Alton Hugh Dods, Kitchener, CA;
Adam Louis Parco, Kitchener, CA;
Assignee:
Blackberry Limited, Waterloo, CA;
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01C 17/38 (2006.01); H04M 1/725 (2006.01); H04M 1/02 (2006.01);
U.S. Cl.
CPC ...
G01C 17/38 (2013.01); H04M 1/72569 (2013.01); H04M 1/0214 (2013.01); H04M 1/72544 (2013.01); H04M 2250/12 (2013.01);
Abstract
A method and system are provided for calibrating a magnetometer. The method comprises determining a current quality level associated with magnetometer readings obtained using an active set of calibration parameters; and lowering a quality threshold for a background calibration of the magnetometer when the current quality level exceeds a threshold quality level needed by an application utilizing the magnetometer readings.