The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Nov. 19, 2010
Applicants:

Junichiro Mataga, Tokyo, JP;

Mizuki Iwanami, Tokyo, JP;

Hiroshi Sakai, Tokyo, JP;

Masatake Takahashi, Tokyo, JP;

Yasuhiro Sasaki, Tokyo, JP;

Inventors:

Junichiro Mataga, Tokyo, JP;

Mizuki Iwanami, Tokyo, JP;

Hiroshi Sakai, Tokyo, JP;

Masatake Takahashi, Tokyo, JP;

Yasuhiro Sasaki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01); G01J 5/10 (2006.01); H01L 37/02 (2006.01); G01N 21/35 (2014.01); G01J 5/06 (2006.01);
U.S. Cl.
CPC ...
G01J 5/10 (2013.01); H01L 37/02 (2013.01); G01N 21/3504 (2013.01); G01J 2005/068 (2013.01); G01N 21/35 (2013.01);
Abstract

Provided is an infrared ray sensor that can conduct a plurality of different types of detection such as temperature detection and gas detection in a simple structure and that is small size and low cost. The infrared ray sensor () includes, on one base (), a first infrared ray detection unit () including at least one infrared ray detection element () including an infrared ray detection material () with physical properties changing depending on properties of incident infrared rays and receives and detects ambient infrared rays, and a second infrared ray detection unit () including at least one infrared ray detection element () having an identical element structure to the infrared ray detection element of the first infrared ray detection unit (), is irradiated with infrared rays X for measurement having specific physical properties, and detects a change in the physical properties of the infrared rays X for measurement.


Find Patent Forward Citations

Loading…