The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2014

Filed:

Jun. 20, 2013
Applicant:

Ming Chuan University, Taipei, TW;

Inventors:

Chaur-Heh Hsieh, Taipei, TW;

Wan-Yu Huang, Taipei, TW;

Jeng-Sheng Yeh, Taipei, TW;

Assignee:

Ming Chuan University, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are virtual glasses try-on method and apparatus, and the apparatus includes an image capturing unit for capturing a user's image and a processing device for detecting a face image from the user's image, storing a glasses model, defining a first feature point of a lens of the glasses model and a second feature point at the center of a frame, and obtaining vertical vectors of the first and second feature points to find a third feature point. Two eye images are searched and binarized into a binarized picture that is divided into an eye area and a non-eye area. A center point between first and second extreme values is found, and vertical vectors of the first extreme value and the center point are obtained to find an example point. An affine transformation of the feature points is performed and attached to the face image to form a try-on image.


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