The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2014
Filed:
Jul. 09, 2011
Applicants:
Herbert Bousack, Aachen, DE;
Helmut Soltner, Inden, DE;
Dirk Mayer, Frechen, DE;
Marko Banzet, Geilenkirchen, DE;
Inventors:
Herbert Bousack, Aachen, DE;
Helmut Soltner, Inden, DE;
Dirk Mayer, Frechen, DE;
Marko Banzet, Geilenkirchen, DE;
Assignee:
Forschungszentrum Juelich GmbH, Juelich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01N 21/84 (2006.01); G01J 5/42 (2006.01);
U.S. Cl.
CPC ...
G01N 21/84 (2013.01); G01J 5/42 (2013.01);
Abstract
A sensor array for measuring the deformation of an area caused by a force, comprises a first strip and a second strip arranged in the same plane on the area so as to form a tunnel junction of which at least the first strip is movably arranged on the area so that the gap between the two strips is increased when the area is deformed as a result of the action of the force.