The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2014
Filed:
Dec. 14, 2011
Alex Chow, Palo Alto, CA (US);
Robert J. Drost, Los Altos, CA (US);
Ronald Ho, Mountain View, CA (US);
Robert D. Hopkins, Mountain View, CA (US);
Ivan E. Sutherland, Portland, OR (US);
Alex Chow, Palo Alto, CA (US);
Robert J. Drost, Los Altos, CA (US);
Ronald Ho, Mountain View, CA (US);
Robert D. Hopkins, Mountain View, CA (US);
Ivan E. Sutherland, Portland, OR (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A semiconductor die is described. This semiconductor die includes a driver, and a spatial alignment transducer that is electrically coupled to the driver and which is proximate to a surface of the semiconductor die. The driver establishes a spatially varying electric charge distribution in at least one direction in the spatial alignment transducer, thereby facilitating determination of a spatial alignment in more than one direction between the semiconductor die and another semiconductor die. In particular, a spatial alignment sensor proximate to the surface of the other semiconductor die may detect an electrical field (or an associated electrostatic potential) associated with the spatially varying electric charge distribution. This detected electric field may allow the vertical spacing between the surfaces of the semiconductor dies and/or an angular alignment of the semiconductor dies to be determined.