The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Sep. 05, 2012
Applicants:

Hyung-gyun Yang, Gyeonggi-do, KR;

Hyung-dong Lee, Gyeonggi-do, KR;

Yong-kee Kwon, Gyeonggi-do, KR;

Young-suk Moon, Gyeonggi-do, KR;

Hong-sik Kim, Gyeonggi-do, KR;

Inventors:

Hyung-Gyun Yang, Gyeonggi-do, KR;

Hyung-Dong Lee, Gyeonggi-do, KR;

Yong-Kee Kwon, Gyeonggi-do, KR;

Young-Suk Moon, Gyeonggi-do, KR;

Hong-Sik Kim, Gyeonggi-do, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This technology relates to smoothly performing a test on a memory circuit having a high memory capacity while reducing the size of a test circuit. A test circuit according to the present invention includes a test execution unit configured to perform a test on a target test memory circuit, an internal storage unit configured to store data for the test execution unit, and a conversion setting unit configured to set a part of or the entire storage space of the target test memory circuit as an external storage unit for storing the data for the test execution unit.


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