The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2014
Filed:
Sep. 14, 2012
Hyunsu Yoon, Gyeonggi-do, KR;
Youncheul Kim, San Jose, CA (US);
Kwanweon Kim, Gyeonggi-do, KR;
Jeongtae Hwang, Gyeonggi-do, KR;
Hyunsu Yoon, Gyeonggi-do, KR;
Youncheul Kim, San Jose, CA (US);
Kwanweon Kim, Gyeonggi-do, KR;
Jeongtae Hwang, Gyeonggi-do, KR;
SK Hynix Inc., Gyeonggi-do, KR;
Abstract
A one-time program cell array circuit includes a cell array configured to include a plurality of one-time program memory cells, and to program an inputted program data and output a stored program data as a read data, a code generation circuit configured to generate an error correction code to be programmed in the cell array based on the inputted program data during a program operation; and an error detection circuit configured to detect an error of the read data based on the error correction code and the read data that are outputted from the cell array during a read operation and to be enabled or disabled in response to a first enable signal. The concern caused by applying the error correction scheme to the one-time program cell array circuit may be resolved by controlling the enabling or disabling of an error correction scheme, while increasing reliability.