The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Nov. 06, 2007
Applicants:

Ming-tao Liou, Fremont, CA (US);

Hwee Har Yeap, San Mateo, CA (US);

Chiun-feng Hsiao, Belmont, CA (US);

Inventors:

Ming-Tao Liou, Fremont, CA (US);

Hwee Har Yeap, San Mateo, CA (US);

Chiun-Feng Hsiao, Belmont, CA (US);

Assignee:

Siebel Systems, Inc, San Mateo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30581 (2013.01); Y10S 707/99942 (2013.01); Y10S 707/99952 (2013.01); Y10S 707/99943 (2013.01);
Abstract

A method, apparatus, and machine-readable medium are disclosed for processing change information from a first system comprising a first database at a second system comprising a second database. An embodiment of the method includes receiving a first message comprising the change information at the second system, processing the first message into a processed message, determining whether a custom script is needed in the processing, and incorporating the change information in the second database. An embodiment of the machine-readable medium includes instructions which when executed by a processor cause the processor to perform the method. An embodiment of the apparatus includes an input module configured to receive the first message comprising the change information, a processing module configured to process the first message into the processed message, and a transaction module configured to incorporate the change information in the second database.


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