The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Nov. 23, 2012
Applicant:

National Chung Cheng University, Chiayi County, TW;

Inventors:

Huei-Yung Lin, Chiayi County, TW;

Xin-Han Zhou, Kaohsiung, TW;

Assignee:

National Chung Cheng University, Chiayi County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/46 (2013.01); G06T 7/0002 (2013.01); G06T 2207/30168 (2013.01);
Abstract

A method for estimating blur degree of image and a method for evaluating image quality are revealed. First, an input image is transmitted to an image processing device for producing a synthesized blur image including a nonlinear image sensing function according to a pixel intensity distribution parameter of the input image. Next, the image processing device matches the pixel intensity distribution according to the input image and the synthesized blur image for producing a blur degree parameter; By the way, the image processing device further estimating an estimated blur result according to the blur degree parameter. The method for estimating blur degree of image can be further applied to estimate blur distribution for a plurality of regions of interest of a plurality of input images. Thereby, the blur distribution of the input images can be estimated, and thus further evaluating the image quality of the plurality of input images.


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