The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Apr. 02, 2009
Applicants:

Tobias Klinder, Eindhoven, NL;

Robin M. B. Wolz, Eindhoven, NL;

Astrid R. Franz, Eindhoven, NL;

Cristian Lorenz, Eindhoven, NL;

Inventors:

Tobias Klinder, Eindhoven, NL;

Robin M. B. Wolz, Eindhoven, NL;

Astrid R. Franz, Eindhoven, NL;

Cristian Lorenz, Eindhoven, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0081 (2013.01); G06T 2207/30012 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/10072 (2013.01);
Abstract

The invention relates to a system for segmenting an object in image data using model-based image segmentation. The system comprises a feature unit for identifying features in the image data for computing an external energy of a mesh on the basis of a current position of the mesh. The feature unit further comprises a candidate feature unit for selecting a plurality of candidate features in the image data. The feature unit further comprises a position unit for determining a position of each candidate feature of the plurality of the candidate features relative to a region of the image data. The feature unit further comprises a feature function unit for computing a strength of each candidate feature. The feature unit further comprises an evaluation unit for evaluating each candidate feature of the plurality of candidate features and for identifying the feature among the plurality of candidate features based on this evaluation.


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