The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2014
Filed:
Feb. 25, 2010
Yoshihiro Kanetani, Fukuchiyama, JP;
Takahiro Suga, Fukuchiyama, JP;
Hiroaki Takimasa, Ayabe, JP;
Naoya Nakashita, Ayabe, JP;
Yusuke Iida, Ayabe, JP;
Yoshihiro Kanetani, Fukuchiyama, JP;
Takahiro Suga, Fukuchiyama, JP;
Hiroaki Takimasa, Ayabe, JP;
Naoya Nakashita, Ayabe, JP;
Yusuke Iida, Ayabe, JP;
Omron Corporation, Kyoto, JP;
Abstract
In a measurement apparatus, higher-quality measurement is realized in measurement of measurement object displacement or imaging of a two-dimensional image. In a controller, a light receiving signal of a photodiode is supplied to a displacement measuring unit of a sensor head in order to measure a height of a measurement object, and the height of a surface of the measurement object is measured based on the light receiving signal. Then, in the controller, image obtaining timing is determined based on the height of the measurement object. Specifically, a focus adjustment value corresponding to the computed height of the measurement object is obtained from the table, and an image obtaining signal is transmitted to an imaging device at the timing the focus adjustment value is realized. Therefore, a length between two points on the measurement object is computed from the thus obtained image based on the height of the measurement object.