The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

May. 03, 2011
Applicants:

Santiago G. Asuncion, San Ramon, CA (US);

Mustansir Fanaswalla, Campbell, CA (US);

Brandon L. Fernandes, Santa Clara, CA (US);

Vaibhav Kamdar, Campbell, CA (US);

Ray L. Jacinto, Gilroy, CA (US);

Inventors:

Santiago G. Asuncion, San Ramon, CA (US);

Mustansir Fanaswalla, Campbell, CA (US);

Brandon L. Fernandes, Santa Clara, CA (US);

Vaibhav Kamdar, Campbell, CA (US);

Ray L. Jacinto, Gilroy, CA (US);

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Circuits and methods characterize a receiver. The circuit includes a decision feedback equalizer (DFE) circuit, a clock and data recovery (CDR) circuit, a data checker, and an eye-scan controller. The DFE circuit generates a filtered signal from the communication signal. The filtered signal is a sum of the communication signal and a variable weighting of a symbol recently sampled from the filtered signal. The CDR circuit samples a sequence of sampled symbols from the filtered signal. The CDR circuit samples the filtered signal at a variable phase relative to a clock signal. The data checker generates an indication of an error in the sequence of sampled symbols. The eye-scan controller varies the variable weighting and the variable phase through multiple value combinations. The eye-scan controller checks for the indication of the error for each of the value combinations.


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