The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Jun. 07, 2013
Applicant:

Litepoint Corporation, Sunnyvale, CA (US);

Inventor:

Minh-Chau Huynh, San Mateo, CA (US);

Assignee:

Litepoint Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01); H04B 1/38 (2006.01);
U.S. Cl.
CPC ...
H04B 17/00 (2013.01); H04B 1/38 (2013.01);
Abstract

A method of facilitating wireless testing of multiple radio frequency (RF) signal transceiver devices under test (DUTs). Using multiple antennas within a shielded enclosure containing the DUTs, multiple wireless RF test signals radiated to the DUTs can have their respective signal phases controlled to maximize the direct-coupled signals to their respective intended DUTs while minimizing the cross-coupled signals. Additionally, the wireless RF test signals radiated to the DUTs can have their respective signal magnitudes controlled to normalize the direct-coupled signals to their respective intended DUTs while still sufficiently reducing the cross-coupled signals. As a result, compensation is provided for the multipath signal environment within the shielded enclosure, thereby simulating wired test signal paths during wireless testing of the DUTs.


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