The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Apr. 11, 2012
Applicants:

Aaron J. Cummings, Williston, VT (US);

Michael T. Fragano, Essex Junction, VT (US);

Kevin W. Gorman, Essex, VT (US);

Kelly A. Ockunzzi, Williston, VT (US);

Michael R. Ouellette, Westford, VT (US);

Inventors:

Aaron J. Cummings, Williston, VT (US);

Michael T. Fragano, Essex Junction, VT (US);

Kevin W. Gorman, Essex, VT (US);

Kelly A. Ockunzzi, Williston, VT (US);

Michael R. Ouellette, Westford, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Aspects of the invention provide a bypass structure for a memory device for reducing unknown test values, and a related method. In one embodiment, a bypass structure for a memory device is disclosed. The bypass structure includes: a logic gate configured to receive a test signal and a clock signal; and an output latch configured to receive an output of the logic gate, an output of the memory device, and a bypass data signal, wherein the output latch is configured to hold the bypass data signal and bypass the output of the memory device in response to asserting the test signal, such that unknown data from the output of the memory device is bypassed.


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