The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Jul. 13, 2013
Applicant:

Lsi Corporation, San Jose, CA (US);

Inventors:

Jefferson E. Singleton, Westminster, CO (US);

Scott Dziak, Ft. Collins, CO (US);

Assignee:

LSI Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G11B 20/182 (2013.01);
Abstract

An apparatus for detecting media flaws includes an envelope based media defect detector operable to identify a media defect based on an envelope of an input signal, a periodic pattern detector operable to determine whether the input signal comprises a data pattern, and a media flaw signal generation circuit operable to indicate a media defect when the envelope based media defect detector identifies the media defect and the periodic pattern detector determines that the input signal does not comprise the data pattern.


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