The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2014
Filed:
Feb. 26, 2009
Michael P. Gleason, Edwardsville, IL (US);
Daniel E. Pulcher, St. Charles, MO (US);
Douglas E. Reed, Washington, MO (US);
Anthony C. Roberts, O'Fallon, MO (US);
Matthew M. Thomas, Maryland Heights, MO (US);
Michael P. Gleason, Edwardsville, IL (US);
Daniel E. Pulcher, St. Charles, MO (US);
Douglas E. Reed, Washington, MO (US);
Anthony C. Roberts, O'Fallon, MO (US);
Matthew M. Thomas, Maryland Heights, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
An optical defect detection system is provided for recording an image of a transparency for detecting optical defects therein. The transparency may be formed with a contour. The defect detection system may comprise a light source, a diffuser and an image recording device for recording images of the transparency. The light source is configured to emit light and may be positioned adjacent one of the sides of the transparency. The image recording device may be positioned on a side of the transparency opposite the diffuser. The diffuser may be contoured complementary to the contour of the transparency and may be positioned between the light source and the transparency.