The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2014
Filed:
Jun. 23, 2014
Applicant:
National University Corporation Okayama University, Okayama-shi, Okayama, JP;
Inventors:
Iori Ohmori, Okayama, JP;
Mamoru Ouchida, Okayama, JP;
Assignee:
National University Corporation Okayama University, Okayama, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01); C12N 15/00 (2006.01); A61K 49/00 (2006.01); A01K 67/027 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
A61K 49/0008 (2013.01); A01K 67/0275 (2013.01); A01K 67/027 (2013.01); G01N 33/5008 (2013.01); A01K 2227/10 (2013.01); A01K 2267/0306 (2013.01);
Abstract
Provided is a method of assessing a potential for development of Dravet syndrome with high accuracy, and use thereof. The method according to the present invention of assessing a potential for development of Dravet syndrome includes, with use of a sample taken from a subject, detecting whether or not a mutation is on α-subunit type 1 of voltage-gated sodium ion channel Na1.1, and detecting whether or not a mutation is on α-subunit type 1 of voltage-gated calcium ion channel Ca2.1.