The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2014
Filed:
Jun. 26, 2007
Yuzuru Iwasaki, Atsugi, JP;
Michiko Seyama, Atsugi, JP;
Toru Miura, Atsugi, JP;
Tsutomu Horiuchi, Atsugi, JP;
Tsuneyuki Haga, Atsugi, JP;
Serge Camou, Atsugi, JP;
Yuzuru Iwasaki, Atsugi, JP;
Michiko Seyama, Atsugi, JP;
Toru Miura, Atsugi, JP;
Tsutomu Horiuchi, Atsugi, JP;
Tsuneyuki Haga, Atsugi, JP;
Serge Camou, Atsugi, JP;
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide an element for SPR measurement without the need of a mechanical solution-sending mechanism. The scope of the present invention is defined by a sensor element for surface plasmon resonance (SPR) measurement utilizing an SPR effect, wherein the sensor element comprises a transparent substrate, a gold thin film formed on at least a part of the transparent substrate, and a thin film with affinity for a sample provided on the transparent substrate having the gold thin film formed on at least a part thereof, and the thin film with affinity for a sample has a measurement region (region A), a sample introduction section (region B) and a sample absorption section (region C) provided with the region A therebetween, the region A is provided with a sample measurement section containing a molecule-recognizing film, an introduction port is formed on the film with affinity for a sample in the region B, an absorption pad is provided on the film with affinity for a sample in the region C so that the whole region C should be covered, and a point in the region B, a point in the region A, and a point in the region C exist in one straight line on the thin film with affinity for a sample.