The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Nov. 06, 2006
Applicants:

Ralf Bickel, Jena, DE;

Alexandra Dworrak, Jena, DE;

Thomas Ellinger, Jena, DE;

Eugen Ermantraut, Jena, DE;

Torsten Schulz, Jena, DE;

Thomas Ullrich, Jena, DE;

Inventors:

Ralf Bickel, Jena, DE;

Alexandra Dworrak, Jena, DE;

Thomas Ellinger, Jena, DE;

Eugen Ermantraut, Jena, DE;

Torsten Schulz, Jena, DE;

Thomas Ullrich, Jena, DE;

Assignee:

Clondiag GmbH, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12M 1/00 (2006.01); C12M 1/34 (2006.01); C12M 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to devices and methods for the detection of specific interactions between probe and target molecules. In particular, the invention relates to methods for the qualitative and/or quantitative detection of targets, including: introducing a sample containing targets into a reaction chamber formed between a first surface of the device and a second surface of a device, which is preferably located opposite to the first surface, wherein the distance between the first and the second surface is variable; and detecting the targets.


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