The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2014
Filed:
May. 09, 2010
Raman Srinivasan, Chennai, IN;
Priyadharshini Sridhar, Chennai, IN;
Swarna Srinivasan, Chennai, IN;
Rohit Kumar, Chennai, IN;
Radhika Jayapaul, Chennai, IN;
Radhika Ganesan, Chennai, IN;
Amit Nath, Chennai, IN;
Vikash Agarwal, Chennai, IN;
Raman Srinivasan, Chennai, IN;
Priyadharshini Sridhar, Chennai, IN;
Swarna Srinivasan, Chennai, IN;
Rohit Kumar, Chennai, IN;
Radhika Jayapaul, Chennai, IN;
Radhika Ganesan, Chennai, IN;
Amit Nath, Chennai, IN;
Vikash Agarwal, Chennai, IN;
Tata Consultancy Services, Ltd., Mumbai, IN;
Abstract
The present invention relates to a system used for competency assessment of candidates. More particularly the present invention relates to an automated system for talent acquisition in an enterprise to identify talented candidates who meet the qualification standards specified by enterprise using a secured and light weight method of providing content including questions and responses in a distributed architecture. The data center server of the system may connect to Knowledge center server to receive the secure test content. The test content is transferred to one or more exam center servers from the data center server. The exam center servers assess the competency of candidates connected to them via candidate console devices (computational devices), by generating unique and standardized test content for each candidate. The system enables less effort, time and consequently money, that multiple test administrators may spend traveling to different test locations to support the system infrastructure.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile