The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2014
Filed:
Mar. 22, 2012
Steffen Kappler, Effeltrich, DE;
Johannes Kippes, Nürnberg, DE;
Edgar Kraft, Erlangen, DE;
Daniel Niederlöhner, Erlangen, DE;
Thomas Reichel, Heroldsbach, DE;
Christian Schröter, Bamberg, DE;
Thomas Von Der Haar, Nürnberg, DE;
Steffen Kappler, Effeltrich, DE;
Johannes Kippes, Nürnberg, DE;
Edgar Kraft, Erlangen, DE;
Daniel Niederlöhner, Erlangen, DE;
Thomas Reichel, Heroldsbach, DE;
Christian Schröter, Bamberg, DE;
Thomas Von Der Haar, Nürnberg, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method, with a current measurement, the history of the radiation exposure of the X-ray detector is taken into account with respect to the overall X-ray detector or subareas of the X-ray detector, in respect of a reduction in the measurement sensitivity produced as a result and a recovery of the reduction in the measurement sensitivity, and the determined measuring signal is corrected with a correction factor which is dependent on the history of the radiation exposure. Furthermore, an X-ray recording system includes a detector which includes a plurality of detector elements, which are read out in groups channel by channel and a read-out apparatus with computer-assisted device for correcting read-out detector data prior to a further processing of the detector data to form projective or tomographic images.