The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 2014

Filed:

Sep. 08, 2010
Applicant:

James Ray Bailey, Georgetown, KY (US);

Inventor:

James Ray Bailey, Georgetown, KY (US);

Assignee:

Lexmark International, Inc., Lexington, KY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 31/317 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31705 (2013.01); G06F 11/2294 (2013.01);
Abstract

An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment of the present invention, an embedded logic analyzer (ELA) receives a plurality of signals from a plurality of buses within an integrated circuit (IC). The ELA includes an interconnect module to select a trigger signal and/or a sampled signal from the plurality of received signals. A trigger module sets at least one trigger condition and detects if the trigger signal satisfies the at least one trigger condition. When the trigger condition is satisfied, an output module performs at least one task based upon the satisfied at least one trigger condition. If a sampling process is initiated by the output module, the plurality of sampled signals is sampled and may be stored in a memory. The capability of the output module to perform multiple user-defined tasks enhances the debugging capability of the ELA and makes it more versatile.


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