The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2014
Filed:
Jan. 03, 2012
Shu Xia Cao, Haidian District Beijing, CN;
Xue Feng Gao, Haidian District Beijing, CN;
DE Shuo Kong, Chang Ping District Beijing, CN;
Shu Xia Cao, Haidian District Beijing, CN;
Xue Feng Gao, Haidian District Beijing, CN;
De Shuo Kong, Chang Ping District Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, and associated data processing system and computer program product, for generating test cases of different types for testing an application. A functional flow of the application is created based on a system design of the application. Additional test information corresponding to different stages of the functional flow with respect to a test types is generated. The generation of additional test information includes utilizing templates associated with the test types. The test cases are generated based on the additional test information and at least one test case generation rule. The test cases of different types are associated with one another.